An Initial Calibration of a Proton Induced X-ray Emission (PIXE) Material Analysis System Using GUPIXWin

ECU Author/Contributor (non-ECU co-authors, if there are any, appear on document)

Robert M Seip (Creator)

Institution

East Carolina University (ECU )

Web Site: http://www.ecu.edu/lib/

Abstract: Proton induced x-ray emission (PIXE) technology has been used extensively over the last few decades to perform highly accurate multi-elemental trace element analyses with much success. The recent implementation of a new PIXE experimental chamber at East Carolina University required a qualification and calibration of the Amptek Fast SDD®, a new state of the art silicon drift diode (SDD) detector, and GUPIXWin, a highly utilized analysis software package. Using 55Fe, a radioactive x-ray source, the detector performed as expected with a resolution of (130 ± 4) eV and a peak to background ratio of 19 000 ± 1000:1. Several thin and thick, mono- and bi-elemental standards were selected to calibrate and calculate the H parameter necessary for trace element concentrations. An energy dependent set of values for H ≈ 0:002 was determined. Finally, the calibration settings were tested by performing a trace element to matrix element ratio analysis on striped bass otoliths from a previous experiment. These results were compared to the previously collected data with few ratios in agreement. Of all analyzed element ratios, Mn:Ca had the most agreement. Some ratios were nearly one order of magnitude different. Recommendations for beam current settings and further calibrations were made.

Additional Information

Publication

Thesis

Language: English

Date: 2020

Keywords

PIXE, Proton, x-ray, GUPIX

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