Robert M Seip

There are 1 included publications by Robert M Seip :

TitleDateViewsBrief Description
An Initial Calibration of a Proton Induced X-ray Emission (PIXE) Material Analysis System Using GUPIXWin 2020 Proton induced x-ray emission (PIXE) technology has been used extensively over the last few decades to perform highly accurate multi-elemental trace element analyses with much success. The recent implementation of a new PIXE experimental chamber at E...