Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System

ECU Author/Contributor (non-ECU co-authors, if there are any, appear on document)

James William,III Eisenmann (Creator)

Institution

East Carolina University (ECU )

Web Site: http://www.ecu.edu/lib/

Abstract: A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department of Physics at East Carolina University , and includes a new high-vacuum beamline on the 2-million-volt tandem Pelletron ion accelerator , which includes a modified multi-sample target chamber. PIXE analysis can provide sensitivities to the parts-per-million level or better for many elements. In this method , a sample is irradiated with protons in the energy range of 1 - 3 MeV from the particle accelerator. Characteristic x-rays emitted from the sample are detected with an x-ray spectrometer , and the emission spectrum is fit using known spectral line energies to determine elemental composition of the sample. Capabilities of the new PIXE analysis system , including a new state-of-the-art x-ray spectrometer and multi-sample target system , will be presented , and proposed multidisciplinary applications , such as in geology , will be discussed.

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Language: English

Date: 2019

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