Methods and systems for optically characterizing a turbid material using a structured incident beam
- ECU Author/Contributor (non-ECU co-authors, if there are any, appear on document)
- Cheng Chen (Creator)
- Xin-hua Hu (Creator)
- Institution
- East Carolina University (ECU )
- Web Site: http://www.ecu.edu/lib/
Abstract: Methods and systems for optically characterizing a turbid sample are provided. A structured light beam is impinged on the sample. The sample includes an embedded region. A reflected light image of the structured light beam is detected from the sample. A measured reflectance image of the structured light beam for the sample is determined based on the reflected light image and a reflectance standard. The following parameters are determined: absorption coefficients ÿa , scattering coefficient ÿs and anisotropy factor g of the sample from the reflectance image. A size parameter of the embedded region is estimated based on the absorption coefficients ÿa , scattering coefficient ÿs and/or anisotropy factor g of the sample from the measured reflectance image.
Additional Information
- Publication
- Other
- Language: English
- Date: 2010
- Keywords
- Subjects
| Title | Location & Link | Type of Relationship |
| Methods and systems for optically characterizing a turbid material using a structured incident beam | http://hdl.handle.net/10342/7538 | The described resource references, cites, or otherwise points to the related resource. |