James William,III Eisenmann

There are 1 included publications by James William,III Eisenmann :

TitleDateViewsBrief Description
Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System 2019 A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department o...